Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray
نویسندگان
چکیده
We discuss important experimental considerations and high-throughput synchrotron-based techniques for structural characterization of binary and ternary composition-spread thin films. We apply these techniques to obtain detailed structural phase diagrams of CoMnGe ternary alloy system. # 2003 Elsevier B.V. All rights reserved. PACS: 61.10.Nz; 07.85.Qe; 68.55.Jk
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